SN74BCT8374ANTG4

SN74BCT8374ANTG4

Part NoSN74BCT8374ANTG4
ManufacturerTexas Instruments
DescriptionIC SCAN TEST DEVICE W/FF 24-DIP
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ECAD Module SN74BCT8374ANTG4
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Specification
PackageTube
Series74BCT
ProductStatusObsolete
LogicTypeScan Test Device with D-Type Edge-Triggered Flip-Flops
SupplyVoltage4.5V ~ 5.5V
NumberofBits8
OperatingTemperature0°C ~ 70°C
MountingTypeThrough Hole
Package/Case24-DIP (0.300, 7.62mm)
SupplierDevicePackage24-PDIP
Grade
Qualification
In Stock: 4104
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Shipping Information
Shiped FromShenZhen Warehourse
Lead TimeCall right now
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